- B -
Bias frame
Acquisition without exposure in order to generate an image of electronic noise only, as opposed to total background noise which includes charge accumulation due to dark current
Binning
Acquisition mode grouping adjacent pixels during readout. The larger resulting pixels collect more light per unit and their lesser number allows higher acquisition speeds.
Blue Enhanced sensor
A sensor type with an increased detection efficiency (QE) for blue & UV wavelengths. Recommended for measurements from 200-450 nm.
- C -
CCCP
CCD Controller for Counting Photons, the patented technology that allows an EMCCD to operate faster and more reliably for low light applications
CCD
Charge-coupled device based on a silicon semiconductor to convert photons in measurable electric signal
CIC
Clock-induced charges, the main noise source in EMCCD cameras in photon counting
Crop mode
Acquisition mode where exposure is restricted to a smaller region of interest and the rest of the detector shielded to be used as a storage area. This allows minimal line transfers after exposure instead of complete frame transfer and results in very fast acquisition rates.
CTE
Charge transfer efficiency, the fraction of electrons displaced between adjacent pixels during the read-out process
- D -
Dark current
A noise source in the form of current resulting of the thermal agitation of atoms that make up the detector
Dark frames
Images without signal. Used to evaluate a camera's noise profile under specific acquisition conditions
- E -
EM gain
Electron-multiplying gain, an amplification parameter used in EMCCDs to obtain less than 1 ē of effective read-out noise
EMCCD
Electron-multiplying CCD, a CCD designed with an extra register for photoelectron amplification by an avalanche effect
ENF
Excess noise factor, a consequence of the stochastic nature of the gain in both EMCCDs and ICCDs that decreases SNR
- F -
Fast kinetic mode
Acquisition mode where exposures are conducted consecutively several times with minimal line transfer before readout. This enables bursts of images with short exposure times and low latency between successive exposures.
- I -
ICCD
Intensified charge-coupled device
IMO
Inverted mode operation, a method of driving the EMCCD detector that minimizes dark current at the expense of increased CIC
- L -
Linear mode
Processing mode where EMCCD camera images are generated linearly in response to incoming light
Low fringing
EMCCD detector optimized for a wide range of visible imaging spanning from near-ultraviolet into near-infrared
Lumogen Coating
A UV conversion coating added to a camera sensor. The Lumogen coating absorbs UV light and re-emits it at higher wavelengths, increasing the camera’s detection efficiency (QE) for UV wavelengths from 200-350 nm.
- M -
Midband
EMCCD detector optimized for visible imaging with a higher sensitivity to blue and red light
mROI
Multiple region of interest
- N -
NIMO
Non-inverted mode operation, a method of driving the EMCCD detector that minimizes CIC at the expense of increased dark current
- P -
Photoelectron
Electron generated in a detector pixel as a result of an incoming photon
Photon counting
Processing mode where the ENF of the EMCCD camera is eliminated by non-linear image generation
- Q -
QE
Quantum efficiency, the fraction of incoming photons that are successfully converted into photoelectrons
- R -
- S -
SDK
Software development kit
Shot noise
Noise resulting from the Poisson distribution of the generation process of particles such as photons and electrons
SNR
Signal-to-noise ratio
- T -
TDI
Time Delay Integration, acquisition mode to capture images of moving objects at very low light levels
Thermal noise
Noise resulting from the shot noise of the dark current
- U -